- Jinkook Kim,Minseok Jeon,Sejeong Jang,Hakjoo Oh, “Automating Endurance Test for Flash-based Storage Devices in Samsung Electronics” [doi]
연구성과
제목 | 오학주 교수 연구실, ICST 2023 논문 채택 (IEEE International Conference on Software Testing, Verification and Validation) |
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